Calgary – September 12th, 2024 – Argyle Resources Corp. (CSE: ARGL) (OTC: ARLYF) (FSE: ME0) (“Argyle” or the “Company”) is excited to announce that our Quebec partner, the Institut National de la Recherche Scientifique (“INRS”), has initiated detailed geological mapping and sampling of outcrop silica structures at the Company’s Matapedia Silica project. These structures (detailed in figure 1-3) were first visually identified during INRS’ reconnaissance trip in July at our fully-owned Matapedia Silica project in St. Moise, Quebec. This pivotal work is a key milestone in our ongoing collaboration with INRS.
Quebec Strategically located Silica District
In July, the INRS conducted a reconnaissance trip to our Matapedia property and identified several crucial outcrop silica structures. These findings are essential for understanding the regional geology of our 912-hectare silica district in St. Moise, Quebec. The ongoing geological mapping and sampling of these outcrops are expected to provide comprehensive insights integral to advancing Argyle’s recently announced pilot plant program, detailed in our August 30, 2024 press release
Pilot Plant
The pilot plant will feature a fully mobile, trailer-mounted series of crushing, grinding, and sorting equipment. This advanced setup facilitates easy assembly, disassembly, and transportation, making it well-suited to our exploration and processing needs. The equipment is designed to process grab samples and, eventually, bulk samples from identified quartzite silica outcrops across our three wholly-owned exploration properties in Quebec.
Real time data
In order to allow the INRS team to perform preliminary assessments of silica quality, Argyle has acquired a cutting-edge X-ray fluorescence (“XRF”) analyzer, a crucial tool for analyzing silica outcrop samples. This portable XRF gun emits X-rays that interact with the atoms in the silica samples. The interaction causes the atoms to emit secondary, or fluorescent, X-rays that are characteristic of their elemental composition. The gun’s detector measures these emitted X-rays, and each element in the sample emits X-rays at distinct energy levels, which are then quantified.
The XRF gun’s software processes these X-ray energies and intensities to determine the sample’s elemental composition. It produces a real-time spectrum displaying the presence and concentration of elements such as silicon, aluminum, iron, and other common elements in silica outcrops. The results are instantly shown on the XRF gun’s screen and can also be downloaded for further analysis.
A Gamma Radiation Spectrometer (“GRS”.) will be used for the field measurement of potassium (“K”) which is one of the main contaminants in Appalachian quartzites. In addition to this element, the spectrometer measures thorium (“Th”) and uranium (“U”). Furthermore, in order to quantify the reflectance properties of the quartzites (whiteness), a high-precision portable colorimeter will be used on the outcrops.
Figures 1-2: Massive high silica Val-Brillant Formation outcrop from the Matapedia property